- Patent Title: Methods and apparatus for predictive modeling in an imaging system
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Application No.: US15962712Application Date: 2018-04-25
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Publication No.: US11428581B2Publication Date: 2022-08-30
- Inventor: Yoshihisa Tabuchi
- Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Applicant Address: US AZ Phoenix
- Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee Address: US AZ Phoenix
- Agency: Dickinson Wright PLLC
- Main IPC: G01K1/20
- IPC: G01K1/20 ; H04N5/225 ; G01K13/00

Abstract:
Various embodiments of the present technology may comprise methods and apparatus for predictive modeling in an imaging system. The methods and apparatus for predictive modeling may comprise various circuits and/or systems configured to measure a temperature and utilize the measured temperature in conjunction with a predictive model to predict a self-heating value, temperature changes, and an ambient temperature.
Public/Granted literature
- US20190331534A1 METHODS AND APPARATUS FOR PREDICTIVE MODELING IN AN IMAGING SYSTEM Public/Granted day:2019-10-31
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