Invention Grant
- Patent Title: Vacuum gauge with an extended dynamic measurement range
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Application No.: US17022988Application Date: 2020-09-16
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Publication No.: US11428596B2Publication Date: 2022-08-30
- Inventor: Liji Huang , Chih-Chang Chen
- Applicant: Liji Huang , Chih-Chang Chen
- Applicant Address: US CA Santa Clara; US CA Cupertino
- Assignee: Liji Huang,Chih-Chang Chen
- Current Assignee: Liji Huang,Chih-Chang Chen
- Current Assignee Address: US CA Santa Clara; US CA Cupertino
- Main IPC: G01L21/12
- IPC: G01L21/12

Abstract:
The design of a vacuum gauge utilizing a micromachined silicon vacuum sensor to measure the extended vacuum range from ambient to ultrahigh vacuum by registering the gas thermal properties at each vacuum range is disclosed in the present invention. This single device is capable of measuring the pressure range from ambient and above to ultrahigh vacuum. This device applies to all types of vacuum measurement where no medium attack silicon is present. The disclosed vacuum gauge operates with thermistors and thermopile on a membrane of the thermal isolation diaphragm structure with a heat isolation cavity underneath.
Public/Granted literature
- US20220082466A1 VACUUM GAUGE Public/Granted day:2022-03-17
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