Invention Grant
- Patent Title: Estimation device and estimation method
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Application No.: US17022833Application Date: 2020-09-16
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Publication No.: US11428612B2Publication Date: 2022-08-30
- Inventor: Norihiko Hana , Masao Akiyoshi , Dehong Liu
- Applicant: MITSUBISHI ELECTRIC CORPORATION , MITSUBISHI ELECTRIC RESEARCH LABORATORIES, INC.
- Applicant Address: JP Tokyo; US MA Cambridge
- Assignee: MITSUBISHI ELECTRIC CORPORATION,MITSUBISHI ELECTRIC RESEARCH LABORATORIES, INC.
- Current Assignee: MITSUBISHI ELECTRIC CORPORATION,MITSUBISHI ELECTRIC RESEARCH LABORATORIES, INC.
- Current Assignee Address: JP Tokyo; US MA Cambridge
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: G01N3/06
- IPC: G01N3/06 ; G01N3/08 ; G01N3/20

Abstract:
A measurement device is configured to set an observation surface on a surface of a structure as a measurement surface to measure a change of the measurement surface as a measurement surface change vector. An estimator is configured to generate an estimation model based on a shape model obtained by modeling a shape of the structure. The estimator is configured to acquire a coefficient vector by solving a norm minimization problem by setting, as parameters, a measurement surface change vector and a part of the estimation model. The coefficient vector forms a sparse solution. The estimator is configured to estimate a change of a crack occurrence surface by determining a candidate surface, which is inside the structure and assumed to have a crack, as the crack occurrence surface, based on the coefficient vector and another part of the estimation model.
Public/Granted literature
- US20220082482A1 ESTIMATION DEVICE AND ESTIMATION METHOD Public/Granted day:2022-03-17
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