Invention Grant
- Patent Title: Arrangement for non-destructive testing and a testing method thereof
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Application No.: US16966777Application Date: 2019-02-01
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Publication No.: US11428671B2Publication Date: 2022-08-30
- Inventor: Zheng Fan , Danylo Lisevych , Xudong Yu
- Applicant: NANYANG TECHNOLOGICAL UNIVERSITY
- Applicant Address: SG Singapore
- Assignee: NANYANG TECHNOLOGICAL UNIVERSITY
- Current Assignee: NANYANG TECHNOLOGICAL UNIVERSITY
- Current Assignee Address: SG Singapore
- Agency: Seed Intellectual Property Law Group LLP
- Priority: SG10201800876X 20180201
- International Application: PCT/SG2019/050058 WO 20190201
- International Announcement: WO2019/151952 WO 20190808
- Main IPC: G01N29/04
- IPC: G01N29/04

Abstract:
An arrangement for non-destructive testing of a component part, which may include a first end surface and a second opposite end surface. The arrangement may include a plurality of discrete piezoelectric transduction elements arranged in a circular array on the first end surface, and an electric wave signal transmitting and receiving unit electrically coupled to the piezoelectric transduction elements. The electric wave signal transmitting and receiving unit may be able to generate an electric excitation wave signal and to receive an electric response wave signal. The piezoelectric transduction elements may deform, upon an application of the electric excitation wave signal, in an in-phase shearing motion parallel to the first end surface and in respective tangential direction with respect to the circular array so as to generate a corresponding structure-borne wave in the component part at the first end surface such that said structure-borne wave can propagate in the component part.
Public/Granted literature
- US20210041399A1 ARRANGEMENT FOR NON-DESTRUCTIVE TESTING AND A TESTING METHOD THEREOF Public/Granted day:2021-02-11
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