Invention Grant
- Patent Title: In-situ testing of electric double layer capacitors in electric meters
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Application No.: US17022684Application Date: 2020-09-16
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Publication No.: US11428752B2Publication Date: 2022-08-30
- Inventor: Matthew E. Kraus , Frank J. Boudreau, Jr.
- Applicant: Landis+Gyr Innovations, Inc.
- Applicant Address: US GA Alpharetta
- Assignee: Landis+Gyr Innovations, Inc.
- Current Assignee: Landis+Gyr Innovations, Inc.
- Current Assignee Address: US GA Alpharetta
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: G01R31/64
- IPC: G01R31/64 ; G01R27/26 ; G06Q50/06 ; G01R31/50

Abstract:
A method for determining degradation of a capacitor in an electric meter includes, charging the capacitor to a predetermined voltage value during a charging period using charging circuitry of the electric meter, discharging the capacitor, during a discharge period, from the predetermined voltage value using discharging circuitry of the electric meter, measuring, during the discharge period, a first capacitor voltage value at a first time and a second capacitor voltage value at a second time later than the first time using capacitor measurement circuitry of the electric meter, determining, by a processor of the electric meter, a capacitance value of the capacitor based on the first voltage value, the second voltage value, the first time, and the second time, comparing the determined capacitance value to a capacitance threshold value, and determining that the capacitor is in a degraded condition when the calculated capacitance value is below the capacitance threshold value.
Public/Granted literature
- US20220082637A1 IN-SITU TESTING OF ELECTRIC DOUBLE LAYER CAPACITORS IN ELECTRIC METERS Public/Granted day:2022-03-17
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