Invention Grant
- Patent Title: Detector for X-ray imaging
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Application No.: US16959542Application Date: 2018-12-31
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Publication No.: US11428830B2Publication Date: 2022-08-30
- Inventor: Peter George Van De Haar , Walter Ruetten , Heidrun Steinhauser , Herman Stegehuis , Onno Jan Wimmers
- Applicant: KONINKLIJKE PHILIPS N.V.
- Applicant Address: NL Eindhoven
- Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee Address: NL Eindhoven
- Agent Larry Liberchuk
- Priority: EP18150035 20180102
- International Application: PCT/EP2018/086898 WO 20181231
- International Announcement: WO2019/134882 WO 20190711
- Main IPC: G01T1/20
- IPC: G01T1/20 ; G01T1/29 ; G01T1/202

Abstract:
An X-ray detector is positioned relative to an X-ray source such that at least a part of a region between the X-ray source and the X-ray detector is an examination region for accommodating an object. The X-ray source and X-ray detector are controlled by a processing unit in order to operate in a first imaging operation mode, a second imaging operation mode, and/or a third imaging operation mode. The detector comprises a first scintillator, a second scintillator, a first sensor array, and a second sensor array. The first scintillator is disposed over the second scintillator such that X-rays emitted from the X-ray source first encounter the first scintillator and then encounter the second scintillator.
Public/Granted literature
- US20210072412A1 DETECTOR FOR X-RAY IMAGING Public/Granted day:2021-03-11
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