Invention Grant
- Patent Title: Method and electronic device for correcting measurement value of sensor
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Application No.: US16759121Application Date: 2018-10-19
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Publication No.: US11429234B2Publication Date: 2022-08-30
- Inventor: Jeehoon Lee , Eungi Min , Yongjin Lee , Suho Lee , Sukwang Lim , Hyungjoon Lim , Seungeun Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Jefferson IP Law, LLP
- Priority: KR10-2017-0146045 20171103
- International Application: PCT/KR2018/012409 WO 20181019
- International Announcement: WO2019/088529 WO 20190509
- Main IPC: G06F3/044
- IPC: G06F3/044 ; G06F3/041 ; H03K17/96

Abstract:
An electronic device according to various embodiments of the present invention may comprise: at least one electrode having conductivity; a capacitance sensor, at least one switch electrically connected between the at least one electrode and the capacitance sensor, and capable of selectively connecting the at least one electrode and the capacitance sensor; and a control circuit, wherein the control circuit measures a first capacitance value by using the capacitance sensor in a state where the at least one switch is open, measures a second capacitance value corresponding to an external object contacting the at least one electrode, by using the capacitance sensor in a state where the at least one switch is connected, corrects the second capacitance value by using the first capacitance value, and determines the corrected second capacitance value as a capacitance value for the external object. Various other embodiments are possible.
Public/Granted literature
- US20210034195A1 METHOD AND ELECTRONIC DEVICE FOR CORRECTING MEASUREMENT VALUE OF SENSOR Public/Granted day:2021-02-04
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