Invention Grant
- Patent Title: Circuit for reducing voltage degradation caused by parasitic resistance in a memory device
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Application No.: US17234276Application Date: 2021-04-19
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Publication No.: US11430508B2Publication Date: 2022-08-30
- Inventor: Jhon Jhy Liaw
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Haynes and Boone, LLP
- Main IPC: G11C11/419
- IPC: G11C11/419 ; G11C11/412

Abstract:
An array of memory cells is arranged into a plurality of columns and rows. A first signal line extends through a first column of the plurality of columns. The first signal line is electrically coupled to the memory cells in the first column. A first end portion of the first signal line is configured to receive a logic high signal from a first circuit during a first operational state of the memory device and a logic low signal from the first circuit during a second operational state of the memory device. A second circuit includes a plurality of transistors. The transistors are configured to be turned on or off to electrically couple a second end portion of the first signal line to a logic low source when the first end portion of the first signal line is configured to receive the logic low signal from the first circuit.
Public/Granted literature
- US20210241826A1 Circuit for Reducing Voltage Degradation Caused By Parasitic Resistance in a Memory Device Public/Granted day:2021-08-05
Information query
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