An automated test equipment (ATE) system comprises a computer system comprising a system controller, wherein the system controller is communicatively coupled to a tester processor, wherein the system controller is operable to transmit instructions to the tester processor. The tester processor is operable to generate commands and data from the instructions for coordinating testing of a device under test (DUT), wherein the DUT supports an arbitrary sector size, and wherein software layers on the tester processor perform computations to be able control data flow between the tester processor and sectors of arbitrary size in the DUT.