Invention Grant
- Patent Title: Semiconductor device and method
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Application No.: US16881916Application Date: 2020-05-22
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Publication No.: US11430865B2Publication Date: 2022-08-30
- Inventor: Shu-Han Chen , Tsung-Ju Chen , Chun-Heng Chen , Chi On Chui
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- Main IPC: H01L29/06
- IPC: H01L29/06 ; H01L29/66 ; H01L21/3115 ; H01L21/306 ; H01L21/311 ; H01L29/78 ; H01L21/02 ; H01L21/265 ; H01L29/10

Abstract:
In an embodiment, a structure includes: a nano-structure; an epitaxial source/drain region adjacent the nano-structure; a gate dielectric wrapped around the nano-structure; a gate electrode over the gate dielectric, the gate electrode having an upper portion and a lower portion, a first width of the upper portion increasing continually in a first direction extending away from a top surface of the nano-structure, a second width of the lower portion being constant along the first direction; and a gate spacer between the gate dielectric and the epitaxial source/drain region.
Public/Granted literature
- US20210233997A1 Semiconductor Device and Method Public/Granted day:2021-07-29
Information query
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