Invention Grant
- Patent Title: Magnetic sensor and inspection device
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Application No.: US17399345Application Date: 2021-08-11
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Publication No.: US11432751B2Publication Date: 2022-09-06
- Inventor: Satoshi Shirotori , Hitoshi Iwasaki , Akira Kikitsu , Yoshihiro Higashi , Yoshinari Kurosaki
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner L.L.P.
- Priority: JPJP2020-201001 20201203
- Main IPC: G01R5/00
- IPC: G01R5/00 ; A61B5/245 ; G01R33/00

Abstract:
According to one embodiment, a magnetic sensor includes a first magnetic element, a second magnetic element, a third magnetic element located between the first and second magnetic elements in a first direction, a fourth magnetic element located between the third and second magnetic elements in the first direction, a first conductive member, a second conductive member, a third conductive member located between the first and second conductive members in the first direction, a fourth conductive member located between the third and second conductive members in the first direction, a first magnetic member, a second magnetic member, a third magnetic member located between the first and second magnetic members in the first direction, a fourth magnetic member located between the third and second magnetic members in the first direction, and a fifth magnetic member located between the third and fourth magnetic members in the first direction.
Public/Granted literature
- US20220175289A1 MAGNETIC SENSOR AND INSPECTION DEVICE Public/Granted day:2022-06-09
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