Invention Grant
- Patent Title: Method and apparatus for process monitoring in additive manufacturing utilizing an image of a negative structure
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Application No.: US16261201Application Date: 2019-01-29
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Publication No.: US11433617B2Publication Date: 2022-09-06
- Inventor: Meredith Elissa Dubelman , Mary Kathryn Thompson , Christopher Barnhill
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Dinsmore & Shohl LLP
- Main IPC: B33Y50/02
- IPC: B33Y50/02 ; B29C64/393 ; B33Y10/00 ; B33Y30/00 ; B29C64/124 ; B29C64/20

Abstract:
A method is provided for controlling an additive manufacturing process in which a layer of resin is deposited on a build surface and selectively cured via selective application of radiant energy so as to define the geometry of a cross-sectional layer of the component, such that uncured resin remaining on the build surface after curing defines a negative structure of the layer being cured. The method includes: using an imaging apparatus to produce an image of the negative structure; evaluating the image of the negative structure and controlling at least one aspect of the additive manufacturing process with reference to the image of the negative structure.
Public/Granted literature
- US20200238624A1 METHOD AND APPARATUS FOR PROCESS MONITORING IN ADDITIVE MANUFACTURING Public/Granted day:2020-07-30
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