Invention Grant
- Patent Title: Displacement detector, surface shape measuring apparatus, and roundness measuring apparatus
-
Application No.: US17336794Application Date: 2021-06-02
-
Publication No.: US11435175B2Publication Date: 2022-09-06
- Inventor: Hideki Morii
- Applicant: Tokyo Seimitsu Co., Ltd.
- Applicant Address: JP Tokyo
- Assignee: Tokyo Seimitsu Co., Ltd.
- Current Assignee: Tokyo Seimitsu Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JPJP2019-077810 20190416
- Main IPC: G01B5/016
- IPC: G01B5/016 ; G01B21/04

Abstract:
Provided are a displacement detector, a surface shape measuring apparatus, and a roundness measuring apparatus capable of measuring displacement in a plurality of directions, having a simple configuration, and capable of highly accurate measurement. A displacement measurer includes: a detector body; a substantially L-shaped stylus having a contactor to be in contact with a measuring surface of an object to be measured; a stylus holding part that is provided in the detector body and holds the stylus in a swingable manner, with a swing plane being a plane including a first direction and a second direction that are perpendicular to each other; and a displacement detecting unit that is provided in the detector body and detects displacement of the contactor associated with contact between the contactor and the measuring surface.
Public/Granted literature
- US20210285751A1 DISPLACEMENT DETECTOR, SURFACE SHAPE MEASURING APPARATUS, AND ROUNDNESS MEASURING APPARATUS Public/Granted day:2021-09-16
Information query