Invention Grant
- Patent Title: Optical distortion measuring apparatus and optical distortion measuring method, image processing system, electronic apparatus and display apparatus
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Application No.: US16956886Application Date: 2020-01-02
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Publication No.: US11435289B2Publication Date: 2022-09-06
- Inventor: Hongzhen Xue , Fuqiang Ma , Yali Liu , Lili Chen , Jiankang Sun , Shuo Zhang
- Applicant: BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD. , BOE TECHNOLOGY GROUP CO., LTD.
- Applicant Address: CN Beijing; CN Beijing
- Assignee: BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.,BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee: BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.,BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee Address: CN Beijing; CN Beijing
- Agency: WHDA, LLP
- Priority: CN201910113048.6 20190213
- International Application: PCT/CN2020/070103 WO 20200102
- International Announcement: WO2020/164335 WO 20200820
- Main IPC: G01N21/66
- IPC: G01N21/66 ; G01M11/02 ; G01N21/88 ; H04N9/31 ; G02B27/01 ; G06T5/00
Abstract:
An optical distortion measurement method that including receiving target field of view information; processing the target field of view information using a coordinate conversion model to obtain screen coordinates of a target angle of view, wherein the coordinate conversion model may be configured to convert image plane coordinates of the target angle of view to screen coordinates of the target angle of view; and outputting at least the screen coordinates of the target angle of view.
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