Invention Grant
- Patent Title: Device, program, and method for determining number of samples required for measurement, and device, program and method for estimating measurement accuracy
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Application No.: US16617398Application Date: 2018-06-25
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Publication No.: US11435334B2Publication Date: 2022-09-06
- Inventor: Takao Ueda , Tatsuya Oki
- Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Applicant Address: JP Tokyo
- Assignee: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Current Assignee: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Current Assignee Address: JP Tokyo
- Agency: Michael Best & Friedrich LLP
- Priority: JPJP2017-194812 20171005
- International Application: PCT/JP2018/024067 WO 20180625
- International Announcement: WO2019/069512 WO 20190411
- Main IPC: G01N33/24
- IPC: G01N33/24 ; G06F17/18 ; G06K9/62

Abstract:
To give reliability to statistical data on samples as discrete materials, a required sample-number determination device includes: a required sample number for each class acquisition unit configured to acquire a required sample number for each class Ni by the following Equation (1) based on a proportion P{circumflex over ( )}i, that is a ratio of the number of samples in each class to the number of the samples in the population; a temporary required sample number acquisition unit configured to acquire a temporary required sample number Nr, which may be a maximum value among the required sample numbers for each class Ni; and a required sample number determination unit configured to determine the temporary required sample number Nr as a true required sample number when the sample number reaches the temporary required sample number Nr or more, [ Mathematical 1 ] N i = ( K P ξ i ) 2 P ^ i ( 1 - P ^ i ) ( 1 ) in Equation (1), ξi denotes a constant for accuracy that is set for each class, KP is a constant depending on set reliability, and i as indices denotes a class number assigned to each class.
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