Invention Grant
- Patent Title: Signal measurement apparatus and signal measurement method
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Application No.: US16778156Application Date: 2020-01-31
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Publication No.: US11435380B2Publication Date: 2022-09-06
- Inventor: Jongpal Kim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: NSIP Law
- Priority: KR10-2019-0116252 20190920
- Main IPC: G01R19/00
- IPC: G01R19/00 ; H03K5/24 ; H03F3/45 ; G01N27/22 ; A61B5/053

Abstract:
A signal measurement apparatus and signal measurement method are provided. The measurement apparatus includes a compensation signal generating circuit configured to generate a target compensation signal that reduces a carrier frequency component in a voltage signal that is input into an amplifier based on an output signal of the amplifier, and the amplifier amplifies the voltage signal to which the target compensation signal is applied, wherein the compensation signal generating circuit is configured to determine a signal value of a subsequent compensation signal based on a signal value of the output signal of the amplifier amplified by applying a previous compensation signal, when determining the target compensation signal.
Public/Granted literature
- US20210088560A1 SIGNAL MEASUREMENT APPARATUS AND SIGNAL MEASUREMENT METHOD Public/Granted day:2021-03-25
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