Invention Grant
- Patent Title: Chip testing system
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Application No.: US17201182Application Date: 2021-03-15
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Publication No.: US11435396B2Publication Date: 2022-09-06
- Inventor: Chen-Lung Tsai , Gene Rosenthal
- Applicant: ONE TEST SYSTEMS
- Applicant Address: US CA Santa Clara
- Assignee: ONE TEST SYSTEMS
- Current Assignee: ONE TEST SYSTEMS
- Current Assignee Address: US CA Santa Clara
- Agency: Li & Cai Intellectual Property (USA) Office
- Priority: TW109136804 20201023
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R1/04 ; G01R31/26

Abstract:
A chip testing system including a tray kit, an insertion member mounting apparatus, a testing apparatus, an insertion member detaching apparatus, and a conveying apparatus are provided. The chip tray kit includes a tray, a plurality of chip fixing members, and a plurality of auxiliary insertion members. The chip fixing members are fixed to the tray and are configured to carry a plurality of chips. The insertion member mounting apparatus can fix the auxiliary insertion members to a side of the chip fixing members, and the auxiliary insertion members can limit a movement range of the chips in the chip fixing members. The insertion member detaching apparatus can detach the auxiliary insertion members. When the chips are tested, a pressing assembly connected to a temperature adjusting device and reaching a predetermined temperature correspondingly presses a surface of each of the chips.
Public/Granted literature
- US20220128621A1 CHIP TESTING SYSTEM Public/Granted day:2022-04-28
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