Invention Grant
- Patent Title: Radiation source supply system for lithographic tools
-
Application No.: US17233090Application Date: 2021-04-16
-
Publication No.: US11435669B2Publication Date: 2022-09-06
- Inventor: Chi-Hung Liao , Yueh Lin Yang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Seed IP Law Group LLP
- Main IPC: G03F7/20
- IPC: G03F7/20

Abstract:
Embodiments described herein provide a lithographic system having two or more lithographic tools connected to a radiation source using two or more variable attenuation units. In some embodiments, the variable attenuation unit reflects a portion of the received light beam to the lithographic tool attached thereto and transmits a remaining portion of the received light beam to the lithographic tools downstream. In some embodiments, the radiation source includes two or more laser sources to provide laser beams with an enhanced power level and which can prevent operation interruption due to laser source maintenances and repair.
Public/Granted literature
- US20210240085A1 RADIATION SOURCE SUPPLY SYSTEM FOR LITHOGRAPHIC TOOLS Public/Granted day:2021-08-05
Information query
IPC分类: