- Patent Title: System and method for detecting change over in manufacturing field
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Application No.: US16874365Application Date: 2020-05-14
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Publication No.: US11435715B2Publication Date: 2022-09-06
- Inventor: Nobuyuki Muranaka
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Procopio, Cory, Hargreaves & Savitch LLP
- Main IPC: G05B19/05
- IPC: G05B19/05

Abstract:
Example implementations described herein are directed to a change over detection system and method. Such example implementations facilitate updating the information of the production line in an Internet of Things (IoT) system to the latest version. Through the example implementations described herein, device rearrangement in manufacturing field can thereby be detected.
Public/Granted literature
- US20210356928A1 SYSTEM AND METHOD FOR DETECTING CHANGE OVER IN MANUFACTURING FIELD Public/Granted day:2021-11-18
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