Invention Grant
- Patent Title: System and method for identifying manufacturing defects
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Application No.: US16693101Application Date: 2019-11-22
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Publication No.: US11435719B2Publication Date: 2022-09-06
- Inventor: Sai MarapaReddy , Shuhui Qu , Janghwan Lee
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Yongin-si
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Yongin-si
- Agency: Lewis Roca Rothgerber Christie LLP
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F9/445 ; G06F9/455 ; H04L29/08 ; G05B19/418 ; G05B19/406 ; G06N3/08

Abstract:
A system and method for classifying products manufactured via a manufacturing process. A processor receives an input dataset, and extracts features of the input dataset at two or more levels of abstraction. The processor combines the extracted features and provides the combined extracted features to a classifier. The classifier is trained based on the combined extracted features for learning a pattern of not-faulty products. The trained classifier is configured to receive data for a product to be classified, to output a prediction for the product based on the received data.
Public/Granted literature
- US20210096530A1 SYSTEM AND METHOD FOR IDENTIFYING MANUFACTURING DEFECTS Public/Granted day:2021-04-01
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