Systems and methods for resonance aware performance management of processing devices. In one aspect, a method includes iteratively testing a performance operation for the processing device, wherein each iteration is performed at an iteration voltage level for a power delivery network. The performance operation is applied at different application periods and at the iteration voltage level for the iteration. If no failure condition is met, the iteration voltage is reduced and another iteration is done. Upon a failure occurring at a particular application period, an operational voltage level for the power delivery network that is based on the iteration voltage level for the iteration in which a failure condition was induced is selected, and application of the performance operation at the particular application period is precluded.