Invention Grant
- Patent Title: Semiconductor device having error correction code (ECC) circuit
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Application No.: US17239471Application Date: 2021-04-23
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Publication No.: US11436084B2Publication Date: 2022-09-06
- Inventor: Takamasa Suzuki
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Priority: JP2015-002415 20150108
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/10 ; G11C29/02 ; G11C29/42 ; G11C29/52 ; G11C11/401 ; G11C29/04

Abstract:
An apparatus may comprise an ECC circuit configured to receive read data from a memory cell array to correct, an error bit contained in a data portion of the read data responsive, at least in part, to a parity portion of the read data, to generate a plurality of first error determination signals and a plurality of second error determination signals. Each of the plurality of first error determination signals provided in common to n data terminals and corresponding to an associated one of burst data of m bits. Each of the plurality of second error determination signals provided in common to the burst data of m bits and corresponding to an associated one of the n data terminals. The error bit of the data portion of the read data is detected based, at least in part, on the first error determination signals and the second error determination signals.
Public/Granted literature
- US20210263796A1 SEMICONDUCTOR DEVICE HAVING ERROR CORRECTION CODE (ECC) CIRCUIT Public/Granted day:2021-08-26
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