Invention Grant
- Patent Title: Automatic part testing
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Application No.: US17379442Application Date: 2021-07-19
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Publication No.: US11436114B2Publication Date: 2022-09-06
- Inventor: Amitabh Mehra , Anil Harwani , William R. Alverson , Grant E. Ley , Jerry A. Ahrens , Mustansir M. Pratapgarhwala , Scott E. Swanstrom
- Applicant: ADVANCED MICRO DEVICES, INC.
- Applicant Address: US CA Santa Clara
- Assignee: ADVANCED MICRO DEVICES, INC.
- Current Assignee: ADVANCED MICRO DEVICES, INC.
- Current Assignee Address: US CA Santa Clara
- Main IPC: G06F11/22
- IPC: G06F11/22

Abstract:
Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.
Public/Granted literature
- US20210349797A1 AUTOMATIC PART TESTING Public/Granted day:2021-11-11
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