An inspection device includes a processor configured to use, as correct image data, read image data obtained by reading an image-formed matter obtained by forming original image data on a recording medium, and, in a case where a first inspection of determining quality of read image data as an inspection target is performed using the correct image data, the read image data being obtained by reading a new image-formed matter, perform a second inspection on a blank portion or a solid portion included in the read image data as the inspection target, the second inspection using the original image data as the correct image data.