Invention Grant
- Patent Title: Image analysis method, image analysis apparatus, program, learned deep layer learning algorithm manufacturing method and learned deep layer learning algorithm
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Application No.: US16192850Application Date: 2018-11-16
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Publication No.: US11436718B2Publication Date: 2022-09-06
- Inventor: Hiroshi Yoshida , Yosuke Sekiguchi , Kazumi Hakamada , Yuki Aihara , Kohei Yamada , Kanako Masumoto , Krupali Jain
- Applicant: National Cancer Center , SYSMEX CORPORATION
- Applicant Address: JP Tokyo; JP Kobe
- Assignee: National Cancer Center,SYSMEX CORPORATION
- Current Assignee: National Cancer Center,SYSMEX CORPORATION
- Current Assignee Address: JP Tokyo; JP Kobe
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: JPJP2017-222166 20171117
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06V10/44 ; G06V10/56 ; G06V20/69 ; G06K9/62 ; G06N3/08
Abstract:
An image analysis method for generating data indicating a tumorigenic state of an image of a tissue or a cell. The image analysis method is an image analysis method for analyzing an image of a tissue or a cell using a deep learning algorithm of a neural network structure, analysis data are generated from the analysis target image including a tissue or cell to be analyzed, the analysis data are input to the deep learning algorithm, and data indicating the tumorigenic state of tissues or cells in the analysis target image are generated by the depth learning algorithm.
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