Invention Grant
- Patent Title: Method of manufacturing semiconductor device
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Application No.: US16059222Application Date: 2018-08-09
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Publication No.: US11437232B2Publication Date: 2022-09-06
- Inventor: Takaya Ishino , Atsushi Takahashi , Kazunori Zaima
- Applicant: Kioxia Corporation
- Applicant Address: JP Tokyo
- Assignee: Kioxia Corporation
- Current Assignee: Kioxia Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JPJP2017-244253 20171220
- Main IPC: H01L27/00
- IPC: H01L27/00 ; H01L21/02 ; H01L21/027 ; H01L27/11582 ; H01L21/311 ; H01L27/11575 ; H01L27/1157

Abstract:
In one embodiment, a method of manufacturing a semiconductor device includes forming a first film on a substrate. The method further includes performing a first process of forming a concave portion in the first film and forming a second film on a surface of the first film that is exposed in the concave portion by using a first gas containing a carbon element and a fluorine element. The method further includes performing a second process of exposing the second film to a second gas containing a hydrogen element or a fluid generated from the second gas.
Public/Granted literature
- US20190189423A1 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE Public/Granted day:2019-06-20
Information query
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