Invention Grant
- Patent Title: System and method for reducing cell area and current leakage in anti-fuse cell array
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Application No.: US16786499Application Date: 2020-02-10
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Publication No.: US11437386B2Publication Date: 2022-09-06
- Inventor: Meng-Sheng Chang , Chia-En Huang , Shao-Yu Chou , Yih Wang
- Applicant: Taiwan Semiconductor Manufacturing Company Limited
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company Limited
- Current Assignee: Taiwan Semiconductor Manufacturing Company Limited
- Current Assignee Address: TW Hsinchu
- Agency: Foley & Lardner LLP
- Main IPC: H01L27/112
- IPC: H01L27/112 ; H01L23/528 ; H01L23/532 ; G11C17/16 ; G06F30/392 ; H01L23/525 ; G11C17/18

Abstract:
A memory device includes a first memory cell having a first polysilicon line associated with a first read word line and intersecting a first active region and a second active region, and a second polysilicon line and a first CPODE associated with a first program word line, the second polysilicon line intersecting the first active region and the first CPODE intersecting the second active region. The memory device also includes a second memory cell adjacent to the first memory cell, the second memory cell having a third polysilicon line associated with a second read word line and intersecting the first active region and the second active region, and a fourth polysilicon line and a second CPODE associated with a second program word line, the fourth polysilicon line intersecting the second active region and the second CPODE intersecting the first active region to form a cross-arrangement of CPODE.
Public/Granted literature
- US20210249422A1 SYSTEM AND METHOD FOR REDUCING CELL AREA AND CURRENT LEAKAGE IN ANTI-FUSE CELL ARRAY Public/Granted day:2021-08-12
Information query
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