Invention Grant
- Patent Title: Fault root cause analysis method and apparatus
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Application No.: US17120605Application Date: 2020-12-14
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Publication No.: US11438212B2Publication Date: 2022-09-06
- Inventor: Jian Li , Zengjun Huang , Min Hu , Bo Xie , Kang Cheng
- Applicant: HUAWEI TECHNOLOGIES CO., LTD.
- Applicant Address: CN Guangdong
- Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee Address: CN Guangdong
- Agency: Womble Bond Dickinson (US) LLP
- Priority: CN201810623804.5 20180615
- Main IPC: H04L41/0631
- IPC: H04L41/0631 ; H04L41/069 ; H04L43/04

Abstract:
A fault root cause analysis method and apparatus are provided. The method includes: obtaining a first alarm event set, where the first alarm event set includes a plurality of alarm events; for a first alarm event in the first alarm event set, extracting a feature vector of the first alarm event, where a part of or all features of the feature vector are used to represent a relationship between the first alarm event and another alarm event in the first alarm event set; and determining, based on the feature vector of the first alarm event, whether the first alarm event is a root cause alarm event. In this application, whether the first alarm event is the root cause alarm event is determined based on a feature vector of the relationship between the first alarm event and the another alarm event, and the accuracy of fault root cause identification is improved.
Public/Granted literature
- US20210099336A1 FAULT ROOT CAUSE ANALYSIS METHOD AND APPARATUS Public/Granted day:2021-04-01
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