Invention Grant
- Patent Title: System monitoring with metrics correlation for data center
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Application No.: US16818475Application Date: 2020-03-13
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Publication No.: US11438245B2Publication Date: 2022-09-06
- Inventor: Simon Tao , Yu Cao , Xiaoyan Guo , Kenneth Durazzo
- Applicant: EMC IP Holding Company LLC
- Applicant Address: US MA Hopkinton
- Assignee: EMC IP Holding Company LLC
- Current Assignee: EMC IP Holding Company LLC
- Current Assignee Address: US MA Hopkinton
- Agency: Ryan, Mason & Lewis, LLP
- Main IPC: H04L43/065
- IPC: H04L43/065 ; H04L43/08

Abstract:
A first set of values for a set of metrics is obtained. A given metric of the set of metrics monitors a given component of a set of components of a computing system. The first set of values is obtained during a period of expected behavior of the computing system. One or more correlations are determined between values of the first set of values to establish one or more expected correlations between values of two or more metrics. A second set of values for the set of metrics is obtained. A determination is made as to whether values of the second set of values maintain the one or more expected correlations determined based on the first set of values.
Public/Granted literature
- US20200220796A1 SYSTEM MONITORING WITH METRICS CORRELATION FOR DATA CENTER Public/Granted day:2020-07-09
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