Invention Grant
- Patent Title: Disaggregated distributed measurement analysis system using dynamic application builder
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Application No.: US16740112Application Date: 2020-01-10
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Publication No.: US11442105B2Publication Date: 2022-09-13
- Inventor: Sriram Mandyam Krishnakumar , Mahesha Guttahalli Lakshmipathy , Satish Kumar Makanahalli Ramaiah , Vishnu Vardhan Kandan , Rovin Jolly Pulikken
- Applicant: Tektronix, Inc.
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Seed IP Law Group LLP
- Agent Andrew J. Harrington
- Priority: IN201921001261 20190110
- Main IPC: G01R31/3183
- IPC: G01R31/3183 ; G01R31/28
Abstract:
Disaggregated distributed measurement analysis systems provide a test and measurement automation platform that uses solution workflow metadata to create automation test suites as solutions to be deployed in an automation engine of a test and measurement automation platform. The automation platform provides tools and techniques to develop measurements and deploy solutions in an automation engine without requiring the system to restart. The system enables, by the test and measurement automation platform, a user to develop measurements for the solutions and deploy and execute each of the solutions in the automation engine of the test and measurement automation platform without requiring the solution to compile.
Public/Granted literature
- US20200225287A1 DISAGGREGATED DISTRIBUTED MEASUREMENT ANALYSIS SYSTEM USING DYNAMIC APPLICATION BUILDER Public/Granted day:2020-07-16
Information query
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