Invention Grant
- Patent Title: Inspection apparatus, sensing apparatus, sensitivity control apparatus, inspection method, and program with pixel sensitivity control
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Application No.: US15575529Application Date: 2016-06-10
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Publication No.: US11448586B2Publication Date: 2022-09-20
- Inventor: Masatoshi Takashima , Yoshihiro Murakami , Hiroshi Mori
- Applicant: Sony Group Corporation
- Applicant Address: JP Tokyo
- Assignee: Sony Group Corporation
- Current Assignee: Sony Group Corporation
- Current Assignee Address: JP Tokyo
- Agency: Michael Best & Friedrich LLP
- Priority: JPJP2015-128878 20150626
- International Application: PCT/JP2016/067321 WO 20160610
- International Announcement: WO2016/208415 WO 20161229
- Main IPC: G01N21/25
- IPC: G01N21/25 ; A01G7/00 ; G01N21/27 ; G01J3/28 ; G01J1/42 ; G01J3/02 ; G01J3/42 ; G01N33/00 ; G01N21/84 ; G01J3/18

Abstract:
The present disclosure relates to an inspection apparatus, a sensing apparatus, a sensitivity control apparatus, an inspection method, and a program that perform inspection with improved accuracy. The inspection apparatus includes a detection section for detecting a plurality of different wavelength region components of ambient light reflected from an inspection target to be inspected, and a control section for controlling the sensitivity of each of the different wavelength region components. The control section controls the sensitivity by calculating a histogram indicating the detection level in every wavelength region of light reflected from the inspection target that is detected by the detection section, and determining, based on histograms of particular spectroscopic components, whether or not the sensitivity is properly set for the detection section. The present technology is applicable, for example, to an inspection apparatus that inspects vegetation.
Public/Granted literature
- US20180136116A1 INSPECTION APPARATUS, SENSING APPARATUS, SENSITIVITY CONTROL APPARATUS, INSPECTION METHOD, AND PROGRAM Public/Granted day:2018-05-17
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