Invention Grant
- Patent Title: Charged particle beam inspection of ungrounded samples
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Application No.: US16470928Application Date: 2017-12-04
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Publication No.: US11448607B2Publication Date: 2022-09-20
- Inventor: Chiyan Kuan
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL AH Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL AH Veldhoven
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
- International Application: PCT/EP2017/081334 WO 20171204
- International Announcement: WO2018/114299 WO 20180628
- Main IPC: G01N23/225
- IPC: G01N23/225 ; H01J37/22 ; H01J37/30 ; H01J37/153 ; H01J37/21

Abstract:
Systems and methods are provided for dynamically compensating position errors of a sample. The system can comprise one or more sensing units configured to generate a signal based on a position of a sample and a controller. The controller can be configured to determine the position of the sample based on the signal and in response to the determined position, provide information associated with the determined position for control of one of a first handling unit in a first chamber, a second handling unit in a second chamber, and a beam location unit in the second chamber.
Public/Granted literature
- US20200088657A1 CHARGED PARTICLE BEAM INSPECTION OF UNGROUNDED SAMPLES Public/Granted day:2020-03-19
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