Invention Grant
- Patent Title: Device and method for testing semiconductor devices
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Application No.: US16981704Application Date: 2020-08-06
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Publication No.: US11448685B2Publication Date: 2022-09-20
- Inventor: Jihua Li , Tao Zhang , Wenjie Lin
- Applicant: INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Applicant Address: CN Zhuhai
- Assignee: INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Current Assignee: INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Zhuhai
- Agency: Idea Intellectual Limited
- Agent Margaret A. Burke; Sam T. Yip
- International Application: PCT/CN2020/107412 WO 20200806
- International Announcement: WO2022/027438 WO 20220210
- Main IPC: G01R31/26
- IPC: G01R31/26

Abstract:
A testing circuit includes a first circuit and a second circuit. The first circuit has a first capacitor and a second capacitor. The first circuit is configured to transfer at least a portion of a first voltage across the first capacitor to the second capacitor. The second circuit has the first capacitor and the second capacitor. The second circuit is configured to transfer at least a portion of a second voltage across the second capacitor to the first capacitor.
Information query