Invention Grant
- Patent Title: Automated optical inspection and classification apparatus based on a deep learning system and training apparatus thereof
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Application No.: US16455243Application Date: 2019-06-27
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Publication No.: US11455528B2Publication Date: 2022-09-27
- Inventor: Arulmurugan Ambikapathi , Chien-Chung Lin , Cheng-Hua Hsieh
- Applicant: UTECHZONE CO., LTD.
- Applicant Address: TW New Taipei
- Assignee: UTECHZONE CO., LTD.
- Current Assignee: UTECHZONE CO., LTD.
- Current Assignee Address: TW New Taipei
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: TW107122640 20180629
- Main IPC: G06N3/08
- IPC: G06N3/08 ; G01N21/01 ; G06N20/00

Abstract:
The present invention provides an automated optical inspection and classification apparatus based on a deep learning system, comprising a camera and a processor. The processor executes a deep learning system after loading data from a storage unit and the processor, and comprises an input layer, a neural network layer group, and a fully connected-layer group. The neural network layer group is for extracting to an input image and thereby obtaining a plurality of image features. The fully connected-layer group is for performing weight-based classification and outputting an inspection result.
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