Invention Grant
- Patent Title: Semiconductor structure and method of manufacturing the same
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Application No.: US16936194Application Date: 2020-07-22
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Publication No.: US11456206B2Publication Date: 2022-09-27
- Inventor: Hsih-Yang Chiu
- Applicant: NANYA TECHNOLOGY CORPORATION
- Applicant Address: TW New Taipei
- Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee Address: TW New Taipei
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L23/528

Abstract:
The present disclosure provides a semiconductor structure with a reduced pitch (half-pitch feature) and a method of manufacturing the same. The semiconductor structure includes a substrate, a dielectric layer, at least one main feature, at least one first conductive feature, at least one first spacer, a plurality of second conductive features, and a plurality of second spacers. The dielectric layer is disposed on the substrate. The main feature is disposed in the dielectric layer and contacting the substrate. The first conductive feature is disposed in the dielectric layer and on the main feature. The first spacer is interposed between the dielectric layer and a portion of the first conductive feature. The second conductive features are disposed in the dielectric layer and on either side of the first conductive feature. The second spacers are interposed between the dielectric layer and portions of the second conductive features.
Public/Granted literature
- US20220028736A1 SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2022-01-27
Information query
IPC分类: