Invention Grant
- Patent Title: Methods and measurement systems for precisely evaluating a device under test
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Application No.: US16712776Application Date: 2019-12-12
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Publication No.: US11456531B2Publication Date: 2022-09-27
- Inventor: Paul Simon Holt Leather , Ramez Askar , Kei Sakaguchi , Thomas Haustein , Leszek Raschkowski
- Applicant: Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Applicant Address: DE Munich
- Assignee: Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Current Assignee: Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Current Assignee Address: DE Munich
- Agency: Perkins Coie LLP
- Agent Michael A. Glenn
- Priority: EP17176398 20170616
- Main IPC: H01Q3/26
- IPC: H01Q3/26 ; H04B17/10 ; H04B17/23 ; H04B5/00 ; H04B10/073
Abstract:
A method includes defining a Center-of-Radiation Reference for a device under test, the CORR indicating a reference origin of an electromagnetic wave pattern formable with the DUT; determining a 3-dimensional orientation information with respect to the CORR, the 3-dimensional orientation information indicating a direction of the electromagnetic wave pattern; and providing the CORR and the 3-dimensional orientation information to a measurement system.
Information query
