Invention Grant
- Patent Title: Monitoring material processing using imaging signal density determined from inline coherent imaging (ICI)
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Application No.: US16721306Application Date: 2019-12-19
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Publication No.: US11458566B2Publication Date: 2022-10-04
- Inventor: Christopher M. Galbraith , Jordan Kanko , Paul J. L. Webster , Cole Van Vlack , Genevieve Elizabeth Hayes
- Applicant: IPG PHOTONICS CORPORATION
- Applicant Address: US MA Oxford
- Assignee: IPG PHOTONICS CORPORATION
- Current Assignee: IPG PHOTONICS CORPORATION
- Current Assignee Address: US MA Oxford
- Agency: Grossman, Tucker, Perreault & Pfleger, PLLC
- Main IPC: B23K26/03
- IPC: B23K26/03 ; B23K31/12 ; B23K26/082 ; G01B9/02001

Abstract:
Systems, methods and apparatuses are used for monitoring material processing using imaging signal density calculated for an imaging beam directed to a workpiece or processing region, for example, during inline coherent imaging (ICI). The imaging signal density may be used, for example, to monitor laser and e-beam welding processes such as full or partial penetration welding. In some examples, the imaging signal density is indicative of weld penetration as a result of reflections from a keyhole floor and/or from a subsurface structure beneath the keyhole. The monitoring may include, for example, automated pass/fail or quality assessment of the welding or material processing or parts produced thereby. The imaging signal density may also be used to control the welding or material processing, for example, using imaging signal density data as feedback. The imaging signal density may be used alone or together with other measurements or metrics, such as distance or depth measurements.
Information query
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