Invention Grant
- Patent Title: Inspecting method and inspection apparatus for membraneelectrode assembly
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Application No.: US17183739Application Date: 2021-02-24
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Publication No.: US11460417B2Publication Date: 2022-10-04
- Inventor: Shinya Takeshita , Toshiyuki Takahara , Masaki Tatsumi
- Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA , HITACHI HIGH-TECH SCIENCE CORPORATION
- Applicant Address: JP Toyota; JP Tokyo
- Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA,HITACHI HIGH-TECH SCIENCE CORPORATION
- Current Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA,HITACHI HIGH-TECH SCIENCE CORPORATION
- Current Assignee Address: JP Toyota; JP Tokyo
- Agency: Hunton Andrews Kurth LLP
- Priority: JPJP2020-030275 20200226
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01N23/18 ; H01M8/04664 ; H01M8/1004 ; G01N23/083 ; G01B15/02 ; G01N23/16

Abstract:
A method of inspecting a membrane-electrode assembly includes obtaining an X-ray transmission image by applying X-rays to the membrane-electrode assembly, and determining whether a foreign matter having a size equal to or larger than a predetermined value is included in the membrane-electrode assembly, according to a brightness reduction amount in each pixel of the X-ray transmission image obtained, while referring to a correlative relationship between the size of the foreign matter measured in a planar direction of the membrane-electrode assembly, and the brightness reduction amount in the X-ray transmission image.
Public/Granted literature
- US20210262949A1 INSPECTING METHOD AND INSPECTION APPARATUS FOR MEMBRANEELECTRODE ASSEMBLY Public/Granted day:2021-08-26
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