Invention Grant
- Patent Title: Apparatus and method for automatically calibrating capacitance per channel
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Application No.: US16840833Application Date: 2020-04-06
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Publication No.: US11460952B2Publication Date: 2022-10-04
- Inventor: Young Jin Seo , Young Gun Heo
- Applicant: ABOV SEMICONDUCTOR CO., LTD.
- Applicant Address: KR Chungcheongbuk-do
- Assignee: ABOV SEMICONDUCTOR CO., LTD.
- Current Assignee: ABOV SEMICONDUCTOR CO., LTD.
- Current Assignee Address: KR Chungcheongbuk-do
- Agency: KED & Associates, LLP
- Priority: KR10-2019-0059827 20190522
- Main IPC: G06F3/041
- IPC: G06F3/041 ; G06F3/044 ; G01R27/26

Abstract:
Disclosed herein are an apparatus and method for automatically calibrating capacitance per channel, for measuring parasitic capacitance values of respective channels due to a difference in a length of a wiring of each capacitance sensing channel when a circuit is designed and adding a unique calibration capacitance value of each channel such that all channels have the same reference capacitance value that is preset, and in detail, the apparatus for automatically calibrating a capacitance per channel includes a touch sensing device including a plurality of touch sensing regions, and a capacitance measurement and calibration device configured to measure parasitic capacitances of channels connected to the plurality of touch sensing regions, respectively, and to add a unique calibration capacitance of each channel to a corresponding channel to acquire a preset reference capacitance when each channel is connected to the parasitic capacitance.
Public/Granted literature
- US20200371144A1 APPARATUS AND METHOD FOR AUTOMATICALLY CALIBRATING CAPACITANCE PER CHANNEL Public/Granted day:2020-11-26
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