Invention Grant
- Patent Title: System and method for inspecting workpieces
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Application No.: US16791349Application Date: 2020-02-14
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Publication No.: US11461887B2Publication Date: 2022-10-04
- Inventor: Mario Blais , Clement Drouin Laberge
- Applicant: PRATT & WHITNEY CANADA CORP.
- Applicant Address: CA Longueuil
- Assignee: PRATT & WHITNEY CANADA CORP.
- Current Assignee: PRATT & WHITNEY CANADA CORP.
- Current Assignee Address: CA Longueuil
- Agency: Norton Rose Fulbright Canada LLP
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T5/50 ; G06T7/70

Abstract:
Methods, systems and devices for inspecting workpieces are described. The method comprises acquiring partial measurement data from a plurality of workpieces associated with a batch of workpieces; composing an inspection data set from the partial measurement data; comparing the inspection data set to a reference data set defining tolerances for the workpieces; and accepting and rejecting the batch of workpieces based on the comparing of the inspection data set to the reference data set.
Public/Granted literature
- US20210256673A1 SYSTEM AND METHOD FOR INSPECTING WORKPIECES Public/Granted day:2021-08-19
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