Invention Grant
- Patent Title: Ligand selection for ternary oxide thin films
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Application No.: US16514351Application Date: 2019-07-17
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Publication No.: US11462398B2Publication Date: 2022-10-04
- Inventor: Martin Michael Frank , John Rozen , Yohei Ogawa
- Applicant: International Business Machines Corporation , ULVAC, Inc.
- Applicant Address: US NY Armonk; JP Kanagawa
- Assignee: International Business Machines Corporation,ULVAC, Inc.
- Current Assignee: International Business Machines Corporation,ULVAC, Inc.
- Current Assignee Address: US NY Armonk; JP Kanagawa
- Agency: Cantor Colburn LLP
- Agent Robert Sullivan
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L29/788 ; H01L29/78 ; H01L45/00

Abstract:
Embodiments of the present invention are directed to forming a ternary compound using a modified atomic layer deposition (ALD) process. In a non-limiting embodiment of the invention, a first precursor and a second precursor are selected. The first precursor includes a first metal and a first ligand. The second precursor includes a second metal and a second ligand. The second ligand is selected based on the first ligand to target a second metal uptake. A substrate is exposed to the first precursor during a first pulse of an ALD cycle and the substrate is exposed to the second precursor during a second pulse of the ALD cycle, the second pulse occurring after the first pulse. The substrate is exposed to a third precursor (e.g., an oxidant) during a third pulse of the ALD cycle. The ternary compound can include a ternary oxide film.
Public/Granted literature
- US20210020426A1 LIGAND SELECTION FOR TERNARY OXIDE THIN FILMS Public/Granted day:2021-01-21
Information query
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