Invention Grant
- Patent Title: Sensing apparatus, rotor, and method for determining presence of abnormality in sensor
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Application No.: US16955484Application Date: 2018-12-18
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Publication No.: US11462972B2Publication Date: 2022-10-04
- Inventor: Won Kyu Kim
- Applicant: LG INNOTEK CO., LTD.
- Applicant Address: KR Seoul
- Assignee: LG INNOTEK CO., LTD.
- Current Assignee: LG INNOTEK CO., LTD.
- Current Assignee Address: KR Seoul
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: KR10-2017-0175103 20171219
- International Application: PCT/KR2018/016107 WO 20181218
- International Announcement: WO2019/124925 WO 20190627
- Main IPC: G01B7/30
- IPC: G01B7/30 ; H02K11/215 ; G01D5/14 ; G01R31/34

Abstract:
Disclosed is a sensing apparatus, characterized in that: a first sensor unit comprises a first hall sensor and a second hall sensor, wherein the first hall sensor outputs two first output values having different phases from each other, and the second hall sensor outputs two second output values having different phases from each other; a second sensor unit outputs a third position detection value of a rotor; and a control unit compares one of the two first output values with one of the two second output values, compares the two first output values with each other, compares the two second output values with each other, compares a first position detection value of the rotor, which is on the basis of the first output values, with a second position detection value of the rotor, which is on the basis of the second output values, and compares at least one of the first position detection value of the rotor and the second position detection value of the rotor, with the third position detection value of the rotor outputted from the second sensor unit.
Public/Granted literature
- US20210006135A1 SENSING APPARATUS, ROTOR, AND METHOD FOR DETERMINING PRESENCE OF ABNORMALITY IN SENSOR Public/Granted day:2021-01-07
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