Invention Grant
- Patent Title: Signal analysis apparatus and signal analysis method
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Application No.: US17478280Application Date: 2021-09-17
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Publication No.: US11463183B2Publication Date: 2022-10-04
- Inventor: Mayfor Dangkiw , Takasumi Ikebe , Hirofumi Kanno
- Applicant: ANRITSU CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: ANRITSU CORPORATION
- Current Assignee: ANRITSU CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Pearne & Gordon LLP
- Priority: JPJP2020-160847 20200925
- Main IPC: H04B17/30
- IPC: H04B17/30 ; H04L25/03

Abstract:
A signal analysis apparatus includes a first frequency conversion unit 10 that generates an intermediate frequency signal SIF2 and a second spurious signal SSP2 from a measured signal SRF of a frequency fRF (center frequency fc), and a second frequency conversion unit 25 that converts the intermediate frequency signal SIF2 and the second spurious signal SSP2 into an intermediate frequency signal SIF2′ of a frequency fIF2′ and a second spurious signal SSP2′ of a frequency fSP2′ by performing frequency shift of the intermediate frequency signal SIF2 and the second spurious signal SSP2 by a frequency shift amount Δf, in which the frequency shift amount Δf is a value that does not establish a relationship of −W/2≤fSP2′−fIF2′≤+W/2.
Public/Granted literature
- US20220103268A1 SIGNAL ANALYSIS APPARATUS AND SIGNAL ANALYSIS METHOD Public/Granted day:2022-03-31
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