A semiconductor device and a method for forming the semiconductor device are provided. The method includes providing a substrate including an NMOS region and a PMOS region, forming an isolation layer on the substrate, forming initial hard mask layers on the isolation layer, and forming hard mask layers by removing a number of initial hard mask layers from the initial hard mask layers. The method also includes forming openings in the isolation layer in the NMOS region by removing portions of the isolation layer covered by the hard mask layers in the NMOS region, forming first fins in the openings in the isolation layer in the NMOS region, forming openings in the isolation layer in the PMOS region by removing portions of the isolation layer covered by the hard mask layers in the PMOS region, and forming second fins in the openings in the isolation layer in the PMOS region.