Invention Grant
- Patent Title: Multi-sensor quality inference and control for additive manufacturing processes
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Application No.: US16987969Application Date: 2020-08-07
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Publication No.: US11478854B2Publication Date: 2022-10-25
- Inventor: Vivek R. Dave , David D. Clark , Matias Roybal , Mark J. Cola , Martin S. Piltch , R. Bruce Madigan , Alberto Castro
- Applicant: Sigma Labs, Inc.
- Applicant Address: US NM Santa Fe
- Assignee: Sigma Labs, Inc.
- Current Assignee: Sigma Labs, Inc.
- Current Assignee Address: US NM Santa Fe
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: B22F10/20
- IPC: B22F10/20 ; B29C64/153 ; B29C64/386 ; B22F10/00 ; B33Y50/02 ; G05B19/418 ; B29C64/393 ; B22F10/30 ; B22F10/10

Abstract:
This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
Public/Granted literature
- US20210060647A1 MULTI-SENSOR QUALITY INFERENCE AND CONTROL FOR ADDITIVE MANUFACTURING PROCESSES Public/Granted day:2021-03-04
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