Invention Grant
- Patent Title: Integrated rotation-angle sensor unit in a measuring system for rotation angle determination
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Application No.: US17001630Application Date: 2020-08-24
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Publication No.: US11486733B2Publication Date: 2022-11-01
- Inventor: Yan Bondar , Marcus Christian Meyer , Hans Christian Paul Dittmann
- Applicant: TDK-Micronas GmbH
- Applicant Address: DE Freiburg
- Assignee: TDK-Micronas GmbH
- Current Assignee: TDK-Micronas GmbH
- Current Assignee Address: DE Freiburg
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: DE102019005876.3 20190822
- Main IPC: G01D5/14
- IPC: G01D5/14 ; H01L43/06 ; H01L43/04 ; G01P3/487

Abstract:
An integrated rotation-angle sensor unit in a measuring system for rotation angle determination, with a shaft that is rotatable about an axis of rotation with a transmitter, The sensor unit has a semiconductor layer with a top surface that can be arranged perpendicular to the axis of rotation and has a bottom surface, and two monolithic Hall sensor systems are implemented in the semiconductor layer. Each Hall sensor system has at least a first Hall sensor, a second Hall sensor, and a third Hall sensor, and the three Hall sensors of the first Hall sensor system are arranged on a first circle that is parallel to the top surface of the semiconductor layer and can be arranged concentrically around the axis of rotation.
Public/Granted literature
- US20210055132A1 INTEGRATED ROTATION-ANGLE SENSOR UNIT IN A MEASURING SYSTEM FOR ROTATION ANGLE DETERMINATION Public/Granted day:2021-02-25
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