Invention Grant
- Patent Title: Probe head with linear probe
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Application No.: US17329465Application Date: 2021-05-25
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Publication No.: US11493536B2Publication Date: 2022-11-08
- Inventor: Tzu-Yang Chen , Chin-Yi Lin , Chen-Rui Wu , Sheng-Yu Lin , Ming-Ta Hsu , Chia-Ju Wei
- Applicant: MPI Corporation
- Applicant Address: TW Chu-pei
- Assignee: MPI Corporation
- Current Assignee: MPI Corporation
- Current Assignee Address: TW Chu-pei
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: TW109117444 20200526,TW109206477 20200526,TW109133701 20200928,TW110110267 20210322
- Main IPC: G01R1/067
- IPC: G01R1/067

Abstract:
A probe head includes upper and lower die units, and a linear probe inserted therethrough and thereby defined with tail, body and head portions. A first bottom surface of the upper die unit and a second top surface of the lower die unit face each other, thereby defining an inner space wherein the body portion is located and includes a plurality of sections each having front width larger than or equal to back width, including a narrowest section whose upper and lower ends have a distance from the first bottom surface and the second top surface respectively. The head and tail portions are offset from each other along two horizontal axes and the body portion is thereby curved. The present invention is favorable in dynamic behavior control of the linear probe which is easy in manufacturing, lower in cost and has more variety in material.
Public/Granted literature
- US20210373048A1 PROBE HEAD WITH LINEAR PROBE Public/Granted day:2021-12-02
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