Invention Grant
- Patent Title: Magnetic sensor and inspection device
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Application No.: US17395623Application Date: 2021-08-06
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Publication No.: US11493571B2Publication Date: 2022-11-08
- Inventor: Hitoshi Iwasaki , Satoshi Shirotori , Akira Kikitsu , Yoshihiro Higashi
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
- Priority: JPJP2020-174624 20201016
- Main IPC: G11C11/16
- IPC: G11C11/16 ; G01R33/09 ; G01R15/20 ; A61B5/245

Abstract:
According to one embodiment of the invention, a magnetic sensor includes a first element part. The first element part includes a first magnetic element, first and s second structures, a first magnetic member, and a second magnetic member. A direction from the first magnetic layer toward the first counter magnetic layer is along a first direction. The first structure includes a first side magnetic layer. The second structure includes a second side magnetic layer. The first magnetic element is between the first structure and the second structure in a second direction crossing the first direction. The first magnetic element is separated from the first side magnetic layer and the second side magnetic layer. A direction from the first side magnetic layer toward the first magnetic member is along the first direction. A direction from the second side magnetic layer toward the second magnetic member is along the first direction.
Public/Granted literature
- US20220120830A1 MAGNETIC SENSOR AND INSPECTION DEVICE Public/Granted day:2022-04-21
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