Invention Grant
- Patent Title: Method and apparatus for analyzing cause of product defect
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Application No.: US17176734Application Date: 2021-02-16
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Publication No.: US11494375B2Publication Date: 2022-11-08
- Inventor: Kwang-Ryel Ryu , Taekwang Kim
- Applicant: Pusan National University Industry-University Cooperation Foundation
- Applicant Address: KR Busan
- Assignee: Pusan National University Industry-University Cooperation Foundation
- Current Assignee: Pusan National University Industry-University Cooperation Foundation
- Current Assignee Address: KR Busan
- Agency: Christensen O'Connor Johnson Kindness PLLC
- Priority: KR10-2020-0180169 20201221
- Main IPC: G06F16/245
- IPC: G06F16/245 ; G06Q10/06 ; G06F16/2453

Abstract:
Disclosed are a method and apparatus for analyzing a cause of a product defect. The apparatus includes a pre-processing unit configured to receive process data and perform pre-processing for analyzing a cause of a product defect, a search unit configured to search for a primary defect cause-conditional sentence to represent a primary defect cause through solution encoding and decoding and solution fitness calculation for a plurality of candidate solutions in order to search for a conditional sentence using the pre-processed process data and to output the primary defect cause-conditional sentence, and a post-processing unit configured to receive the primary defect cause-conditional sentence, remove a redundant conditional sentence, and output the final defect cause-conditional sentence.
Public/Granted literature
- US20220197244A1 METHOD AND APPARATUS FOR ANALYZING CAUSE OF PRODUCT DEFECT Public/Granted day:2022-06-23
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