Invention Grant
- Patent Title: Low voltage ferroelectric memory cell sensing
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Application No.: US17236734Application Date: 2021-04-21
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Publication No.: US11501816B2Publication Date: 2022-11-15
- Inventor: Daniele Vimercati
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Holland & Hart LLP
- Main IPC: G11C11/22
- IPC: G11C11/22

Abstract:
Methods, systems, and devices for low voltage ferroelectric memory cell sensing are described. As part of an access operation for a memory cell, gates of two cascodes may be biased to compensate for associated threshold voltages. An extracted signal corresponding to a charge stored in the memory cell may be transferred through a first cascode to charge a first capacitor. Similarly, a reference signal developed at a dummy digit line may be transferred through a second cascode to charge a second capacitor. By comparing the reference signal developed at the dummy digit line to the extracted signal from the memory cell, the effect of variations in memory cell performance on the sense window may be reduced. Additionally, based on biasing the gates of the cascodes, the difference between the signals compared at the sense component may be low compared to other sensing schemes.
Public/Granted literature
- US20210312968A1 LOW VOLTAGE FERROELECTRIC MEMORY CELL SENSING Public/Granted day:2021-10-07
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